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020 _z9812567585
020 _z9789812567581
020 _z9789812773760
035 _a(CaPaEBR)ebr10201334
039 9 _y201007121404
_zVLOAD
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aTA169
_b.A84 2006eb
111 2 _aAsian International Workshop on Advanced Reliability Modeling
_n(2nd :
_d2006 :
_cPusan, Korea)
245 1 0 _aAdvanced reliability modeling II
_h[electronic resource] :
_breliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006 /
_cedited by Won Young Yun, Tadashi Dohi.
246 3 0 _aProceedings of the 2nd Asian International Workshop
246 3 _aAIWARM 2006
260 _aSingapore ;
_aHong Kong :
_bWorld Scientific,
_cc2006.
300 _axvii, 795 p. :
_bill.
504 _aIncludes bibliographical references and index.
529 _aTSLHHL
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2009.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aReliability (Engineering)
_xMathematical models
_vCongresses.
650 0 _aComputer networks
_xReliability
_vCongresses.
655 7 _aElectronic books.
_2local
700 1 _aDohi, Tadashi.
700 1 _aYun, Won Young.
710 2 _aebrary, Inc.
_925628
856 4 0 _uhttp://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10201334
_zAn electronic book accessible through the World Wide Web; click to view
999 _c95431
_d95431