Taylor's Library

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Principles of failure analysis. Tape 4, Fatigue failures [videorecording]

by ASM International.

Publisher: Materials Park, Ohio : ASM International, c1992Other title: Fatigue failures..Availability: Items available for loan: Taylor's Library-TU [Call number: 620.112 PRI] (1).
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Journal of materials engineering and performance [electronic resource].

by ASM International.

Source: Computers & Applied Sciences CompletePublisher: Materials Park, OH : ASM International, c1992-Other title: JMEP.Online access: Full text available: Oct 2008-. (Due to publisher restrictions, the most recent 12 months are not available.). Available on EBSCOhost. Availability: No items available
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Scripta materialia [electronic resource].

by ASM International | American Institute of Mining, Metallurgical, and Petroleum Engineers.

Source: Academic Source CompletePublisher: Tarrytown, NY : Pergamon, c1995-Online access: Abstracts Available: Jan 2002- Available on EBSCOhost. Availability: No items available
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Acta materialia [electronic resource].

by ASM International | American Institute of Mining, Metallurgical, and Petroleum Engineers.

Source: Academic Source CompletePublisher: Tarrytown, NY ; Oxford, England : Elsevier Science, c1995-Other title: Acta mater..Online access: Abstracts Available: Jan 2002- Available on EBSCOhost. Availability: No items available
Friction, lubrication, and wear technology / prepared under the direction of the ASM International Handbook Committee ; volume editor, George E. Totten.

by ASM International. Handbook Committee | ASM International.

Publisher: Materials Park, Ohio : ASM International, [2017]Copyright date: ©2017Availability: Items available for loan: Taylor's Library-TU [Call number: 620.1692 FRI 2017] (1).
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ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International.

by International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.) | ASM International | Electronic Device Failure Analysis Society | ebrary, Inc.

Publisher: Materials Park, OH : ASM International, c2008Other title: Proceedings of the 34th International Symposium for Testing and Failure Analysis | 34th International Symposium for Testing and Failure Analysis | Thirty-fourth International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Parametric analyses of high-temperature data for aluminum alloys [electronic resource] / J. Gilbert Kaufman.

by Kaufman, J. G. (John Gilbert), 1931- | ASM International | ebrary, Inc.

Publisher: Materials Park, Ohio : ASM International, c2008Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 620.1861] (1).
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Advanced materials & processes [electronic resource].

by American Society for Metals | ASM International.

Source: Academic Source CompletePublisher: [Metals Park, Ohio : American Society for Metals, c1985-Other title: Advanced materials and processes.Online access: Full text available: Jul 1996-. Available on EBSCOhost. Availability: No items available
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International materials reviews [electronic resource].

by Institute of Metals | ASM International.

Source: Academic Source CompletePublisher: London : Metals Park, Ohio : Institute of Metals ; ASM International, 1987-Online access: Accessible through the World Wide Web; click to view Availability: No items available
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ISTFA 2011 [electronic resource] : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.

by International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.) | ASM International | Electronic Device Failure Analysis Society | ebrary, Inc.

Publisher: Materials Park, Ohio : ASM International, 2011Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available