Taylor's Library catalog › Results of search for 'au:"Electronic Device Failure Analysis Society."'

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		No cover image available ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Publisher: Materials Park, OH : ASM International, c2008Other title: Proceedings of the 34th International Symposium for Testing and Failure Analysis \| 34th International Symposium for Testing and Failure Analysis \| Thirty-fourth International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
		No cover image available ISTFA 2011 [electronic resource] : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. by International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Publisher: Materials Park, Ohio : ASM International, 2011Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available