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		No cover image available Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin. by Dumin, D. J \| ebrary, Inc. Publisher: [River Edge, NJ] : World Scientific, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.39/732] (1). Place hold

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