Taylor's Library

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Terahertz science and technology for military and security applications [electronic resource] / editors, Dwight L. Woolard ... [et al.].

by Woolard, Dwight L | ebrary, Inc.

Publisher: Hackensack, NJ : World Scientific, c2007Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 681/.2] (1).
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High-speed optical transceivers [electronic resource] : integrated circuits designs and optical devices techniques / Yuyu Liu, Huazhong Yang, [editors].

by Liu, Yuyu | Yang, Huazhong | ebrary, Inc.

Publisher: Hackensack, NJ : World Scientific, c2006Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.382/7] (1).
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Transformational science and technology for the current and future force [electronic resource] : proceedings of the 24th US Army Science Conference / editors, J.A. Parmentola ... [et al.].

by Army Science Conference (24th : 2004 : Orlando, Fla.) | Parmentola, John A | ebrary, Inc.

Publisher: New Jersey : World Scientific, c2006Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 355.80973] (1).
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Frontiers in electronics [electronic resource] : proceedings of the WOFE-04, Wyndham Aruba Beach Resort, 17-23 December 2004 / edited by H. Iwai ... [et al.].

by Workshop on Frontiers in Electronics (2004 : Aruba) | Iwai, H | ebrary, Inc.

Publisher: New Jersey : World Scientific, 2006Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.381] (1).
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Design of high-speed communication circuits [electronic resource] / editor, Ramesh Harjani.

by Harjani, Ramesh, 1959- | ebrary, Inc.

Publisher: New Jersey : World Scientific, 2006Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.3192] (1).
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Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.

by Dumin, D. J | ebrary, Inc.

Publisher: [River Edge, NJ] : World Scientific, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.39/732] (1).
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