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Advanced semiconductor devices [electronic resource] : proceedings of the 2006 Lester Eastman Conference, Cornell, Ithaca, NY, USA, 26 August 2006 / editors, Michael S. Shur, Paul Maki, James Kolodzey.
by IEEE Lester Eastman Conference on High Performance Devices (2006 : Cornell University) | Shur, Michael | Maki, Paul A, 1956- | Kolodzey, James | ebrary, Inc. Publisher: Singapore ; Hackensack, NJ : World Scientific, c2007Other title: Proceedings of the 2006 Lester Eastman Conference.Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Radiation defect engineering [electronic resource] / Kozlovski Vitali, Abrosimova Vera.
by Kozlovskiĭ, V. V. (Vitaliĭ Vasilʹevich) | Abrosimova, Vera | ebrary, Inc. Publisher: New Jersey ; London : World Scientific, c2005Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Breakdown phenomena in semiconductors and semiconductor devices [electronic resource] / Michael Levinshtein, Juha Kostamovaara, Sergey Vainshtein.
by Levinshtein, M. E. (Mikhail Efimovich) | Kostamovaara, Juha | Vainshtein, Sergey | ebrary, Inc. Publisher: New Jersey ; London : World Scientific, c2005Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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GaN-based materials and devices [electronic resource] : growth, fabrication, characterization and performance / editors, M.S. Shur, R.F. Davis.
by Shur, Michael | Davis, Robert F. (Robert Foster), 1942- | ebrary, Inc. Publisher: Singapore ; River Edge, N.J. : World Scientific, c2004Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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SiC materials and devices. Vol. 1 / [electronic resource] / edited by Michael Shur, Sergey Rumyantsev, Michael Levinshtein.
by Shur, Michael | Rumyantsev, Sergey L | Levinshtein, M. E. (Mikhail Efimovich) | ebrary, Inc. Publisher: New Jersey : World Scientific, 2006Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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CMOS RF modeling, characterization and applications [electronic resource] / editors, M. Jamal Deen, Tor A. Fjeldly.
by Deen, M. Jamal | Fjeldly, Tor A | ebrary, Inc. Publisher: River Edge, N.J. : World Scientific, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Quantum dots [electronic resource] / editors, E. Borovitskaya, Michael S. Shur.
by Borovitskaya, E. (Elena) | Shur, Michael | ebrary, Inc. Publisher: River Edge, N.J. : World Scientific, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
by Dumin, D. J | ebrary, Inc. Publisher: [River Edge, NJ] : World Scientific, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan:
[Call number: 621.39/732]
(1).
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