Taylor's Library catalog › Results of search for 'se,phr:"Frontiers in electronic testing."'

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		No cover image available Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. by Nadeau-Dostie, Benoit \| ebrary, Inc. Publisher: Boston : Kluwer Academic, c2000Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.385] (1). Place hold
		No cover image available A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E \| ebrary, Inc. Publisher: Boston : Kluwer Academic Publishers, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.381] (1). Place hold
		No cover image available Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto. by Benso, Alfredo \| Prinetto, Paolo \| ebrary, Inc. Publisher: Boston : Kluwer Academic Publishers, c2003Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 004.2/56] (1). Place hold
		No cover image available Verification by error modeling [electronic resource] : using testing techniques in hardware verification / written by Katarzyna Radecka, Zeljko Zilic. by Radecka, Katarzyna \| Zilic, Zeljko \| ebrary, Inc. Publisher: Boston : Kluwer Academic Publishers, 2003Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.39/5] (1). Place hold
		No cover image available High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams. by Adams, R. Dean \| ebrary, Inc. Publisher: Boston : Kluwer Academic, c2003Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.39/732] (1). Place hold
		No cover image available Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. by Nicolici, Nicola \| Al-Hashimi, Bashir \| ebrary, Inc. Publisher: Boston : Kluwer Academic Publishers, c2003Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.39/5/0287] (1). Place hold
		No cover image available Boundary-scan interconnect diagnosis [electronic resource] / José T. de Sousa, Peter Y.K. Cheung. by Sousa, Jose T. de \| Cheung, Peter Y. K \| ebrary, Inc. Publisher: Boston : Kluwer Academic Publishers, c2001Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.381] (1). Place hold